EWI Congratulates Awardees on Recent Laser Beam Profiling Patent
We are pleased to announce the award of a new patent to EWI’s Jacob Hay and Stan Ream, with partner Craig Walters, for the development of a Laser Beam Profiling System.
This unique solution can analyze laser beam focal spot size, shape, and quality in several locations on an L-PBF work plane. It has the potential to eliminate many expensive and time-consuming qualification builds. The system is described in the 2020 article, A Solution for Laser Beam Quality Analysis in L-PBF AM Production.
Congratulations to Jacob, Stan, and Craig for their outstanding work.
To discuss this work and learn more about this promising technology, contact [email protected]
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